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Titre
Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit for LEO Space Applications
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BSO - Titre
Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit For LEO Space Applications
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DOI
DOI
10.1109/tns.2017.2691403
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DOAI
DOAI
10.1109/tns.2017.2691403
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Identifiant WoS
WOS:000411034700014
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Accès ouvert
OA - Non
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Source - Accès ouvert
OA - Non
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Type d'accès
Non OA
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Editeur
IEEE - Institute of Electrical and Electronics Engineers
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Source
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
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ISSN
0018-9499
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Type de document
Article
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Notoriété
4 - Excellente
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CNRS
Oui
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CNRS - Institut
INSIS - Institut des sciences de l'ingénierie et des systèmes
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uid:/T53R6P0P
12/10/2021 14:52:52 (latest)
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