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Titre
Defect and field-enhancement characterization through electron-beam-induced current analysis
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BSO - Titre
Defect and field-enhancement characterization through electron-beam-induced current analysis
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DOI
DOI
10.1063/1.4982590
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DOAI
DOAI
10.1063/1.4982590
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Identifiant WoS
WOS:000400931900030
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Accès ouvert
OA - Non
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Source - Accès ouvert
OA - Non
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Type d'accès
Non OA
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Editeur
AIP Publishing
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Source
APPLIED PHYSICS LETTERS
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ISSN
0003-6951
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Type de document
Article
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Notoriété
4 - Excellente
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CNRS
Oui
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CNRS - Institut
INP - Institut de physique
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uid:/XNM10S5W
12/10/2021 14:52:42 (latest)
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